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Deep-Learning-Models-for-Defect-Detection

Some methods about automated thermography defects detection

1.Papers

If you want to know more about the infrared thermal data and some relevant deep learning methods, you could choose to read relevant papers, listed as follows:
[1] Bozhen Hu, Bin Gao, Wai Lok Woo,etc. “A Lightweight Spatial and Temporal Multi-Feature Fusion Network for Defect Detection,” IEEE Trans. Image Processing, 2020.
[2] Lingfeng Ruan, Bin Gao, Shichun Wu, and Wai Lok Woo, Joint Loss Structured Deep Adversarial Network for Thermography Defect Detecting System, Neurocomputing, vol. 417, no. 2020, pp. 441-457, Sep 2020
[3] Qin Luo, Bin Gao, Wailok Woo, and Yang Yang, Temporal and spatial deep learning network for infrared thermal defect detection, NDT and E International, vol. 108, no. 102164, pp. 1-13, Aug 2019
You can find the above papers, and other more papers through this link: http://faculty.uestc.edu.cn/gaobin/zh_cn/lwcg/153392/list/index.htm

2.Data

This is flat type data from Optical Pulsed Thermography(OPT) system, you can download it through Google cloud storage by this link: https://drive.google.com/file/d/1r_x-cFsKaQtXRl5yehhfvLQ3pTXE8DKI/view?usp=sharing After download the data-plane_0.tar.gz, put this in the research folder, then:

tar zxvf plane_0.tar.gz
mkdir pca_imgs
python pca.py

you can get the pca-processed results in the pca_imgs folder for all the data in the plane_0 folder.
one of the examples is N1_1.png:

When you check the values of these mat files in the plane_0 folder, if you find some of them are under zero, you may get confused of these negative values, because all of values represent the real-time temperature of one specimen, why the temperature is less than zero? Because every frame of these infrared thermal data was subtracted by it's first frame in order to reduce the influence of the background and noise.

3.Dependencies

python version:3.7.9
tensorflow version:2.2.0
There are some other dependencies, like matplotlib,opencv-python,etc, you can find these in .py files, when necessary, you can install them. It's pretty easy.

4.Labels

The prevalent way to label these thermal iamges is using Labelme tool, because when doing one experment, the euipments do not move, so we think one mat file have one ground truth. Three experienced human annotators have been employed to annotate the original thermal image sequences or the processed images by PCA algorithm independently. We can use pca to process these mat files first to deepen the defect information through pca.py. Then we can use labelme to label pca images, we can get json files. After that, if we want to get png/jpg format files for labels, we can use LabelMe_proceed.py to convert json files into png or jpg images.
The converted labels can be seen in research/labels folder

5.Methods

Now, in the research folder, it contains several methods to process these data, including PCA, K-Means, Region-Growing, LSTM, UNet, UNet++..., apart from these, it also has some channel and spatial attention blocks, several loss functions.... We are working hard and struggling to give more examples and more robust models.

6.Issues

When you process these thermal data, you can easily find that you only have a small number of samples, so you need to consider Data Augmentation, Class Imbalance. Moreover, these thermal data is similar to each other, which suffers from low resolution, high noise as well as uneven heating, so maybe you have to pretrain, reduce noise, and avoid overfitting, it is easily to overfit using supervised learning.Sometimes, if necessary, you also need to condiser thermal diffusion, it's difficult to calculate specific numbers of defect pixels in an infrared thermal image.

Reference

@article{hu2020lightweight,
  title={A lightweight spatial and temporal multi-feature fusion network for defect detection},
  author={Hu, Bozhen and Gao, Bin and Woo, Wai Lok and Ruan, Lingfeng and Jin, Jikun and Yang, Yang and Yu, Yongjie},
  journal={IEEE Transactions on Image Processing},
  volume={30},
  pages={472--486},
  year={2020},
  publisher={IEEE}
}

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