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Merge pull request #37 from AMReX-Microelectronics/paper_input
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added negf input for all scripts described in the paper
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saurabh-s-sawant authored Nov 15, 2024
2 parents 29c6681 + 8483b65 commit 22a01ac
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
###############
# Description:
# This test case models planar CNTFET simulation with 20 CNTs (100 nm long)
# and with variations in the spacing between adjacent CNTs.
#
# It can be used to produce Fig 5a,5b,5c in the ELEQTRONeX paper.
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
###############
# Description:
# This test case models planar CNTFET simulation with 1 CNT (100 nm long)
# and with periodic boundary conditions.
# It can be used to produce the periodic curve in Fig 5a and 5b.
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
###############
# Description:
# This test case models planar CNTFET simulation with 20 CNTs (100 nm long)
# and with variations in the spacing between adjacent CNTs.
#
# It can be used to produce Fig 5d,5e,5f in the ELEQTRONeX paper.
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 20 CNTs with
# large angular variations. Setup is the same as in the reference
# below with distance between CNTs of ~3.2 nm.
#
# It can be used to verify that it would produce results similar to
# 5 CNTs with angular variations.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 5 CNTs
# with angular variations. Setup is the same as in the reference
# below with distance between CNTs of ~3.2 nm.
#
# It can be used to produce Fig 4a (5 CNTs with angular variation) in the ELEQTRONeX paper.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 5 CNTs
# and small variations in angles. Setup is the same as in the
# reference below with distance between CNTs of ~3.2 nm.
#
# It can be used to verify that with small variations in angles
# we obtain the same result as the parallel CNTs case.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 5 parallel CNTs.
# Setup is the same as in the reference below with distance
# between CNTs of ~3.2 nm.
#
# It can be used to produce Fig 4a (5 CNTs parallel) in the ELEQTRONeX paper.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
###############################################################
# Description:
# This script models planar CNTFET with periodic boundary
# conditions as described in the Ref. below It can be used
# to reproduce Fig. 2d in the ELEQTRONeX paper.
# The output conductance can be compared with the reference
# below for periodicity distance d = 3.195 nm ≈ 3.2 nm
# (see `width_factor` defined below).
#
# Reference:
# Léonard, F. (2006). Crosstalk between nanotube devices:
# contact and channel effects. Nanotechnology, 17(9), 2381.
# DOI: 10.1088/0957-4484/17/9/029
###############################################################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 20 CNTs.
# Setup is the same as in the reference below with distance
# between CNTs of 12.8 nm. CNTs are misaligned.
#
# It can be used to produce Fig 4c (20CNTs curve) and Fig. 4d
# in the ELEQTRONeX paper.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 5 CNTs.
# Setup is the same as in the reference below with distance
# between CNTs of 12.8 nm.
#
# It can be used to produce Fig 4c (5 CNT curve) in the ELEQTRONeX paper.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
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################
# Test case for validation of periodic boundary conditions -- infinite array of nanotubes.
# The output of conductance can be compared with the result from the following reference,
# Fig. 2), periodicity distance, d=3.195 nm == 3.2 nm. (see width_factor defined below).
###############
# Description:
# This test case models planar CNTFET simulation with 5 CNTs.
# Setup is the same as in the reference below with distance
# between CNTs of 12.8 nm.
#
# It can be used to produce Fig 4c (periodic curve) in the ELEQTRONeX paper.
#
# Léonard, F. (2006). Crosstalk between nanotube devices: contact and channel effects.
# Nanotechnology, 17(9), 2381.
################
################

################
##### FLAGS ####
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